Point in Time LGD and EAD models for IFRS/CECL and Stress Testing
In this journal article, we offer options for formulation of PIT LGD and EAD models, and show that, by accounting for the probabilistic evolution over time in industry-region credit-cycle indices, one can derive joint, PD, LGD, EAD scenarios for use in IFRS9/CECL and Stress Testing. Contact us for the final published article.